Naoya Shibata Professor

TEL +81-3-5841-0415
FAX +81-3-5841-7694

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研究分野 interface physics scanning transmission electron microscopy, materials science, ceramics


My research goal is to understand the fundamental mechanisms of interface properties in materials and devices, and to establish the guideline to design them from the atomic-scale. I mainly use atomic-resolution scanning transmission electron microscopy to directly characterize the atomic structures of materials interfaces. We are developing the researches as the following:
a) Grain boundary and interface studies in oxide materials
b) Development of scanning transmission electron microscopy (STEM) and related techniques
c) In-situ transmission electron microscopy studies of materials deformation and fractures
d) Nanocharacterization of heterogeneous catalysts e) Development of novel devices using crystalline defects


R. Ishikawa, S.D. Findlay, T. Seki, G. Sánchez-Santolino, Y. Kohno, Y. Ikuhara and N. Shibata, “Direct electric field imaging of graphene defects,” Nature comm., 9, 3878 (2018).
N. Shibata, S. D. Findlay, T. Matsumoto, Y. Kohno, T. Seki, G. Sánchez-Santolino and Y. Ikuhara, “Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy,” Acc. Chem. Res., 50, 1502-1512 (2017).
N. Shibata, T. Seki, G. Sánchez-Santolino, S.D. Findlay, Y. Kohno, T. Matsumoto, R. Ishikawa and Y. Ikuhara, “Electric field imaging of single atoms,” Nature Comm. 8, 15631 (2017).
T. Matsumoto, Y.-G. So, Y. Kohno, H. Sawada, Y. Ikuhara and N. Shibata, “Direct observation of Σ7 grain boundary core structure in magnetic Skyrmion lattice,” Sci. Adv. 2, e1501280 (2016).
N. Shibata, S.D. Findlay, Y. Kohno, H. Sawada, Y. Kondo and Y. Ikuhara, "Differential phase-contrast microscopy at atomic resolution," Nature Phys., 8, 611-615 (2012).